Freestanding ferroelectric thin film with robust ferroelectricity via inserted dielectric layers

Autor: Dai, Liyufen a, b, 1, Yao, Dijie b, c, 1, An, Feng b, Cheng, Mingqiang b, Zhong, Xiangli a, ⁎, Tang, Zhenhua c, ⁎, Zhong, Gaokuo b, ⁎
Zdroj: In Materials Today Communications January 2025 42
Databáze: ScienceDirect