Study on microstructure control of copper-tin biphase interface in hot-dip tin-plated electronic copper strip

Autor: Ouyang, Yulu a, Liu, Yahui b, ⁎, Zhu, Qianqian a, Zhang, Guoshang c, ⁎⁎, Song, Kexing c, Huang, Tao a, Lu, Weiwei d, Liu, Dong e, Liu, Aikui e, Wang, Binbin a, Li, Qi a
Zdroj: In Journal of Materials Research and Technology November-December 2024 33:7169-7181
Databáze: ScienceDirect