Estimation of TiO2 thin film shift by electronic speckle interferometry
| Autor: | Arul, A.R., Ramalingam, H.B., Balamurugan, R., Venckatesh, R. |
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| Zdroj: | In Materials Today: Proceedings 2023 92 Part 2:1352-1355 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Arul, A.R., Ramalingam, H.B., Balamurugan, R., Venckatesh, R. |
|---|---|
| Zdroj: | In Materials Today: Proceedings 2023 92 Part 2:1352-1355 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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