Defect-induced Stress Imaging in Single and Multi-crystalline Semiconductor Materials
| Autor: | Herms, Martin, Wagner, Matthias, Kayser, Stefan, Kießling, Frank M., Poklad, Anna, Zhao, Ming, Kretzer, Ulrich |
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| Zdroj: | In Materials Today: Proceedings 2018 5(6) Part 3:14748-14756 |
| Databáze: | ScienceDirect |
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