Anomaly detection towards zero defect manufacturing using generative adversarial networks

Autor: Ghansiyal, Shradha, Yi, Li, Simon, Peter M., Klar, Matthias, Müller, Marius Marvin, Glatt, Moritz, Aurich, Jan C.
Zdroj: In Procedia CIRP 2023 120:1457-1462
Databáze: ScienceDirect