Random ferroelectric and dielectric phase distribution-induced device variation of negative capacitance field-effect transistors
| Autor: | Lü, Weifeng, Chen, Dengke, Zhang, Caiyun, Wei, Weijie, Han, Ying |
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| Zdroj: | In Results in Physics April 2023 47 |
| Databáze: | ScienceDirect |
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