Measuring Patent Value Indicators with Patent Renewal Information
| Autor: | Og, Joo Young, Pawelec, Krzysztof, Kim, Byung-Keun *, Paprocki, Rafal, Jeong, EuiSeob |
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| Zdroj: | In Journal of Open Innovation: Technology, Market, and Complexity March 2020 6(1) |
| Databáze: | ScienceDirect |
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