Low Stress Encapsulants? Influence of Encapsulation Materials on Stress and Fracture of Thin Silicon Solar Cells as Revealed by Synchrotron X-ray Submicron Diffraction
Autor: | Rengarajan, Karthic Narayanan, Radchenko, Ihor, Illya, Gregoria, Handara, Vincent, Kunz, Martin, Tamura, Nobumichi, Budiman, Arief Suriadi |
---|---|
Zdroj: | In Procedia Engineering 2016 139:76-86 |
Databáze: | ScienceDirect |
Externí odkaz: |