Atomic Force Microscopy as a Valuable Tool in an Innovative Multi-scale and Multi-technique Non-invasive Approach to Surface Cleaning Monitoring

Autor: Pereira, C., Ferreira, I.M.P.L.V.O., Branco, L.C., Sandu, I.C.A., Busani, T.
Zdroj: In Procedia Chemistry 2013 8:258-268
Databáze: ScienceDirect