Atomic Force Microscopy as a Valuable Tool in an Innovative Multi-scale and Multi-technique Non-invasive Approach to Surface Cleaning Monitoring
Autor: | Pereira, C., Ferreira, I.M.P.L.V.O., Branco, L.C., Sandu, I.C.A., Busani, T. |
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Zdroj: | In Procedia Chemistry 2013 8:258-268 |
Databáze: | ScienceDirect |
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