Predicting bulk lifetime values by applying wet chemistry H-termination for inline quality control of silicon wafers
Autor: | Al-Hajjawi, Saed, Haunschild, Jonas, Zimmer, Martin, Dannenberg, Tobias, Preu, Ralf |
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Zdroj: | In Energy Procedia September 2017 124:2-9 |
Databáze: | ScienceDirect |
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