On the defect responsible for the carrier injection-induced degradation of uncompensated n-type Czochralski silicon
| Autor: | Letty, Elénore, Veirman, Jordi, Favre, Wilfried, Albaric, Mickaël, Danel, Adrien, Lemiti, Mustapha |
|---|---|
| Zdroj: | In Energy Procedia September 2017 124:657-664 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|