Impact of annealing on the formation and mitigation of carrier-induced defects in multi-crystalline silicon
| Autor: | Fung, Tsun Hang, Chan, Catherine E., Hallam, Brett J., Payne, David N.R., Abbott, Malcolm D., Wenham, Stuart R. |
|---|---|
| Zdroj: | In Energy Procedia September 2017 124:726-733 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|