Silicon Minority-carrier Lifetime Degradation During Molecular Beam Heteroepitaxial III-V Material Growth

Autor: Ding, Laura, Zhang, Chaomin, Nærland, Tine Uberg, Faleev, Nikolai, Honsberg, Christiana, Bertoni, Mariana I.
Zdroj: In Energy Procedia August 2016 92:617-623
Databáze: ScienceDirect