Investigation of Laser-fired Rear-side Point Contacts of Laser-crystallized Silicon Thin-film Solar Cells by Conductive Probe Atomic Force Microscopy
| Autor: | Gref, O., Sandström, J., Weizman, M., Rhein, H., Gall, S., Schlatmann, R., Boit, C., Friedrich, F. |
|---|---|
| Zdroj: | In Energy Procedia 2014 60:76-80 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|