Investigation of Self Interstitial Influences in Light and Dark Induced Degradation in p-type Compensated Silicon
Autor: | Yen, V. Mong-the, Barakel, D., Périchaud, I., Palais, O. |
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Zdroj: | In Energy Procedia 2012 27:76-81 |
Databáze: | ScienceDirect |
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