Learning trustworthy model from noisy labels based on rough set for surface defect detection
| Autor: | Niu, Tongzhi, Wang, Zhenrong, Li, Weifeng, Li, Kai, Li, Yuwei, Xu, Guiyin, Li, Bin |
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| Zdroj: | In Applied Soft Computing November 2024 165 |
| Databáze: | ScienceDirect |
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