Charge-trap memory effect in spray deposited ZnO-based electrolyte-gated transistors operating at low voltage
| Autor: | Vieira, Douglas Henrique, Nogueira, Gabriel Leonardo, Nascimento, Mayk Rodrigues, Fugikawa-Santos, Lucas, Alves, Neri |
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| Zdroj: | In Current Applied Physics September 2023 53:118-125 |
| Databáze: | ScienceDirect |
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