Effect of vanadium oxide interfacial layer for electrical contact on p-type silicon
| Autor: | Oh, Gyujin, Kim, Eun Kyu |
|---|---|
| Zdroj: | In Current Applied Physics October 2016 16(10):1315-1319 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Oh, Gyujin, Kim, Eun Kyu |
|---|---|
| Zdroj: | In Current Applied Physics October 2016 16(10):1315-1319 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect