High mobility field effect transistor of SnOx on glass using HfOx gate oxide

Autor: Ju, Chanjong, Park, Chulkwon, Yang, Hyeonseok, Kim, Useong, Kim, Young Mo, Char, Kookrin
Zdroj: In Current Applied Physics March 2016 16(3):300-304
Databáze: ScienceDirect