Effect of W impurity on resistance switching characteristics of NiO x films

Autor: Kim, Jonggi, Na, Heedo, Lee, Sunghoon, Sung, Yong-Hun, Yoo, Jung-Ho, Lee, Doo-Sung, Ko, Dae-Hong, Sohn, Hyunchul
Zdroj: In Current Applied Physics 2011 11(2) Supplement:e70-e74
Databáze: ScienceDirect