Real-time interface investigation on degradation mechanism of organic light-emitting diode by in-operando X-ray spectroscopies

Autor: Nie, Kaiqi, Zhang, Hui, McLeod, John A., Zhang, Duo, Zhou, Dongying, Xia, Yujian, Zhong, Jun, Liao, Liangsheng, Guo, Jinghua **, Sun, Xuhui *
Zdroj: In Organic Electronics December 2020 87
Databáze: ScienceDirect