A resistor network simulation model for laser-scanning photo-current microscopy to quantify low conductance regions in organic thin films
| Autor: | Darwish, M., Boysan, H., Liewald, C., Nickel, B., Gagliardi, A. |
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| Zdroj: | In Organic Electronics November 2018 62:474-480 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect