A prognostic model for multi-stage degraded equipment under zero life label combining CDBN and Bayesian bidirectional GRU

Autor: Pei, Hong, Si, Xiaosheng, Zhang, Zhengxin, Du, Dangbo, Hu, Changhua, Chang, Xinlong
Zdroj: In Advanced Engineering Informatics October 2024 62 Part B
Databáze: ScienceDirect