Oxygen-related micro-defects in Czochralski silicon annealed at enhanced stress conditions
| Autor: | Misiuk, A a, ∗, Surma, H.B b, Lopez, M c |
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| Zdroj: | In International Journal of Inorganic Materials December 2001 3(8):1197-1199 |
| Databáze: | ScienceDirect |
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