Impact of leakage current in germanium channel based DMDG TFET using drain-gate underlap technique
Autor: | Gracia, D., Nirmal, D., Moni, D. Jackuline |
---|---|
Zdroj: | In AEUE - International Journal of Electronics and Communications November 2018 96:164-169 |
Databáze: | ScienceDirect |
Externí odkaz: |