Comparison of SOFC cathode microstructure quantified using X-ray nanotomography and focused ion beam–scanning electron microscopy

Autor: Nelson, George J., Harris, William M., Lombardo, Jeffrey J., Izzo, John R., Jr., Chiu, Wilson K.S., Tanasini, Pietro, Cantoni, Marco, Van herle, Jan, Comninellis, Christos, Andrews, Joy C., Liu, Yijin, Pianetta, Piero, Chu, Yong S.
Zdroj: In Electrochemistry Communications 2011 13(6):586-589
Databáze: ScienceDirect
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