Study of the nanoscale electrical performance of NiO thin films by C-AFM and KPFM techniques: The effect of grain boundary barrier
| Autor: | Zhang, Yidong, Zuo, Junxiang, Li, Pinjiang, Gao, Yuanhao, He, Weiwei, Zheng, Zhi |
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| Zdroj: | In Physica E: Low-dimensional Systems and Nanostructures July 2019 111:75-78 |
| Databáze: | ScienceDirect |
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