Structural and optical properties of Si nanocrystals embedded in SiO 2/SiN x multilayers

Autor: Delachat, F., Carrada, M., Ferblantier, G., Slaoui, A., Bonafos, C., Schamm, S., Rinnert, H.
Zdroj: In Physica E: Low-dimensional Systems and Nanostructures 2009 41(6):994-997
Databáze: ScienceDirect