Optical tomography for dielectric profiling in processing electronic materials
Autor: | Zeni, L. *, Bernini, R., Pierri, R. |
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Zdroj: | In Chemical Engineering Journal 15 April 2000 77(1-2):137-142 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Zeni, L. *, Bernini, R., Pierri, R. |
---|---|
Zdroj: | In Chemical Engineering Journal 15 April 2000 77(1-2):137-142 |
Databáze: | ScienceDirect |
Externí odkaz: |