X-ray multiple diffraction on the shallow junction of B in Si(0 0 1)
| Autor: | Orloski, R.V. *, Pudenzi, M.A.A., Hayashi, M.A., Swart, J.W., Cardoso, L.P. |
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| Zdroj: | In Journal of Molecular Catalysis. A, Chemical 2005 228(1):177-182 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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