Effect of ternary compound on HfO2-Al2O3 mixture coatings revealed by solid-state NMR and TOF-SIMS

Autor: Wen, Jiahui, Ke, Liang, Ren, Jinjun, Shao, Jianda, Zhu, Meiping
Zdroj: In Materials Science in Semiconductor Processing December 2024 184
Databáze: ScienceDirect