The Normal/Umklapp/Intervally/Intravally transport property of 2D SnSe

Autor: Guo, Donglin, Li, Chunhong, Li, Kejian, Shao, Bin, Luo, Xianfu, Sun, Jianchun, Ma, Yilong
Zdroj: In Materials Science in Semiconductor Processing 1 November 2024 182
Databáze: ScienceDirect