Influence of carbon on Ni gettering in C2Hx+ and SiHy+ mixture molecular-ion-implanted silicon epitaxial wafer
Autor: | Hirose, Ryo, Onaka-Masada, Ayumi, Okuyama, Ryosuke, Kadono, Takeshi, Kobayashi, Koji, Suzuki, Akihiro, Koga, Yoshihiro, Kurita, Kazunari |
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Zdroj: | In Materials Science in Semiconductor Processing May 2024 174 |
Databáze: | ScienceDirect |
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