Experimental insights toward carrier localization in in-rich InGaAs/InP as candidate for SWIR detection: Microstructural analysis combined with optical investigation
| Autor: | Ben Arbia, Marwa a, ∗, Demir, Ilkay b, Kaur, Navpreet c, Saidi, Faouzi a, d, Zappa, Dario c, Comini, Elisabetta c, Altuntaş, Ismail b, Maaref, Hassen a |
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| Zdroj: | In Materials Science in Semiconductor Processing January 2023 153 |
| Databáze: | ScienceDirect |
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