Improved surface morphology and crystalline quality of semi-polar ([formula omitted]) AlN epilayer with dual moderate-temperature-grown AlN interlayers

Autor: Luo, Xuguang, Zhang, Xiong, Chen, Bin, Shen, Yang, Tian, Yong, Fan, Aijie, Chen, Shuai, Qian, Yingda, Zhuang, Zhe, Hu, Guohua
Zdroj: In Materials Science in Semiconductor Processing 15 June 2022 144
Databáze: ScienceDirect