Polarized dependence of soft X-ray absorption near edge structure of ZnO films implanted by Yb
| Autor: | Syryanyy, Y., Zając, M., Guziewicz, E., Wozniak, W., Melikhov, Y., Chernyshova, M., Ratajczak, R., Demchenko, I.N. |
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| Zdroj: | In Materials Science in Semiconductor Processing 15 June 2022 144 |
| Databáze: | ScienceDirect |
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