The relationship between structural and electrical properties of the post-deposition annealed Er2O3/n-Si hetero-structures
| Autor: | Kahraman, Aysegul, Morkoc, Berk, Yilmaz, Ercan |
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| Zdroj: | In Materials Science in Semiconductor Processing 1 August 2021 130 |
| Databáze: | ScienceDirect |
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