GISAXS analysis of Ge nanoparticles embedded ZnO thin films: The effect of oxygen partial pressure and thermal process on the nanostructured aggregations
Autor: | Çınar Bam, Begüm, Ide, Semra, Keilbach, Andreas, Ceylan, Abdullah |
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Zdroj: | In Materials Science in Semiconductor Processing 15 November 2017 71:145-150 |
Databáze: | ScienceDirect |
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