GISAXS analysis of Ge nanoparticles embedded ZnO thin films: The effect of oxygen partial pressure and thermal process on the nanostructured aggregations

Autor: Çınar Bam, Begüm, Ide, Semra, Keilbach, Andreas, Ceylan, Abdullah
Zdroj: In Materials Science in Semiconductor Processing 15 November 2017 71:145-150
Databáze: ScienceDirect