Reprint of: Electron channelling contrast imaging for III-nitride thin film structures
| Autor: | Naresh-Kumar, G., Thomson, D., Nouf-Allehiani, M., Bruckbauer, J., Edwards, P.R., Hourahine, B., Martin, R.W, Trager-Cowan, C. |
|---|---|
| Zdroj: | In Materials Science in Semiconductor Processing 15 November 2016 55:19-25 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect