Annealing effects on electrical and optical properties of a-Si:H layer deposited by PECVD
Autor: | Elghoul, N., Kraiem, S., Jemai, R., Zebentout, B., Khirouni, K. |
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Zdroj: | In Materials Science in Semiconductor Processing December 2015 40:302-309 |
Databáze: | ScienceDirect |
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