Role of Schottky barrier height at source/drain contact for electrical improvement in high carrier concentration amorphous InGaZnO thin film transistors
Autor: | Trinh, Thanh Thuy, Jang, Kyungsoo, Velumani, S., Dao, Vinh Ai, Yi, Junsin |
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Zdroj: | In Materials Science in Semiconductor Processing October 2015 38:50-56 |
Databáze: | ScienceDirect |
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