Aging effects on the stability of nitrogen-doped and un-doped InGaZnO thin-film transistors

Autor: Raja, Jayapal, Jang, Kyungsoo, Balaji, Nagarajan, Qamar Hussain, Shahzada, Velumani, S., Chatterjee, Somenath, Kim, Taeyong, Yi, Junsin
Zdroj: In Materials Science in Semiconductor Processing September 2015 37:129-134
Databáze: ScienceDirect