Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy
| Autor: | Kask, E., Grossberg, M., Josepson, R., Salu, P., Timmo, K., Krustok, J. |
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| Zdroj: | In Materials Science in Semiconductor Processing June 2013 16(3):992-996 |
| Databáze: | ScienceDirect |
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