Raman spectroscopy determination of composition and strain in [formula omitted] heterostructures

Autor: Pezzoli, F., Bonera, E., Grilli, E., Guzzi, M., Sanguinetti, S., Chrastina, D., Isella, G., von Känel, H., Wintersberger, E., Stangl, J., Bauer, G.
Zdroj: In Materials Science in Semiconductor Processing 2008 11(5):279-284
Databáze: ScienceDirect