Carrier lifetime studies in Ge using microwave and infrared light techniques
| Autor: | Gaubas, E., Bauža, M., Uleckas, A., Vanhellemont, J. |
|---|---|
| Zdroj: | In Materials Science in Semiconductor Processing 2006 9(4):781-787 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Gaubas, E., Bauža, M., Uleckas, A., Vanhellemont, J. |
|---|---|
| Zdroj: | In Materials Science in Semiconductor Processing 2006 9(4):781-787 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
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