Spatially resolved X-ray diffraction measurements on (Al,Ga)N/GaN/4H-SiC heterostructures for electronic devices
| Autor: | Kirste, L., Müller, S., Kiefer, R., Quay, R., Köhler, K., Herres, N. |
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| Zdroj: | In Materials Science in Semiconductor Processing 2006 9(1):8-14 |
| Databáze: | ScienceDirect |
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