Low-temperature molecular beam epitaxy of Ge on Si

Autor: Leitão, J.P. *, Fonseca, A., Sobolev, N.A., Carmo, M.C., Franco, N., Sequeira, A.D., Burbaev, T.M., Kurbatov, V.A., Rzaev, M.M., Pogosov, A.O., Sibeldin, N.N., Tsvetkov, V.A., Lichtenberger, H., Schäffler, F.
Zdroj: In Materials Science in Semiconductor Processing 2005 8(1):35-39
Databáze: ScienceDirect