Comparative study of point defects induced in PbTe thin films doped with Ga by different techniques

Autor: Samoylov, Alexander M *, Buchnev, Sergey A, Khoviv, Alexander M, Dolgopolova, Emma A, Zlomanov, Vladimir P
Zdroj: In Materials Science in Semiconductor Processing 2003 6(5):481-485
Databáze: ScienceDirect