Femtosecond nonlinear optical characterisation of silicon wafers: the role of symmetry
| Autor: | Reif, J. *, Schneider, Th., Wolfframm, D., Schmid, R.P. |
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| Zdroj: | In Materials Science in Semiconductor Processing 6 February 2001 4(1-3):241-243 |
| Databáze: | ScienceDirect |
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