Electrical defect study in thin-film SiGe/Si solar cells
| Autor: | Daami, A., Zerrai, A., Marchand, J.J., Poortmans, J, Brémond, G. * |
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| Zdroj: | In Materials Science in Semiconductor Processing 6 February 2001 4(1-3):331-334 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect